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Renke Bienert

Two news stories about Renke Bienert


NFC World

Real-time video shows Cilab’s high-speed NFC tester in action

By Mike Clark • 15 January 2020 • Updated 12 February 2021 • nfcw.com
Screenshot of Cilab ci230 high speed NFC tester in action

PARTNER NEWS: A new video from Cilab shows how the company’s high-speed test equipment can be used to reduce the costs and complexity of NFC testing, by completing a full EMVCo PCD Level 1 test in just 42 minutes — a process that typically takes most of a full working day... More


NFC World

NXP picks Cilab’s NFC tester to support customers developing EMV 3.0 POS terminals

By Sarah Clark • 27 September 2019 • Updated 27 September 2019 • nfcw.com
Nxp's Renke Bienert in nfc test lab

PARTNER NEWS: Cilab’s new ci230 high-speed testing suite is “a tool that has been missing for years,” Renke Bienert, senior principal engineer at NXP’s worldwide customer application and support team in Hamburg, has told NFC World... More


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